Deep learning enabled laser speckle wavemeter with a high dynamic range

Graham Bruce
Friday 25 October 2019

Roopam K. Gupta, Graham D. Bruce, Simon J. Powis and Kishan Dholakia

https://arxiv.org/abs/1910.10702

The speckle pattern produced when a laser is scattered by a disordered medium has recently been shown to give a surprisingly accurate or broadband measurement of wavelength. Here we show that deep learning is an ideal approach to analyse wavelength variations using a speckle wavemeter due to its ability to identify trends and overcome low signal to noise ratio in complex datasets. This combination enables wavelength measurement at high resolution and over a broad operating range in a single step, which has not been possible with previous approaches. We demonstrate attometre-scale wavelength resolution over an operating range from 488 nm to 976 nm. This dynamic range is six orders of magnitude beyond the state of the art.

Related topics

Share this story