Random super-prism wavelength meter

Michael Mazilu, Tom Vettenburg, Andrea Di Falco, and Kishan Dholakia Optics Letters 39(1), p. 96-99 (2014) doi: 10.1364/OL.39.000096 The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On...